Thi Hai Binh Nguyen, Van Huan Nguyen, Hakil Kim. Robust Feature Extraction for Facial Image Quality Assessment. In Yongwha Chung, Moti Yung, editors, Information Security Applications - 11th International Workshop, WISA 2010, Jeju Island, Korea, August 24-26, 2010, Revised Selected Papers. Volume 6513 of Lecture Notes in Computer Science, pages 292-306, Springer, 2010. [doi]
@inproceedings{NguyenNK10-0, title = {Robust Feature Extraction for Facial Image Quality Assessment}, author = {Thi Hai Binh Nguyen and Van Huan Nguyen and Hakil Kim}, year = {2010}, doi = {10.1007/978-3-642-17955-6_22}, url = {http://dx.doi.org/10.1007/978-3-642-17955-6_22}, researchr = {https://researchr.org/publication/NguyenNK10-0}, cites = {0}, citedby = {0}, pages = {292-306}, booktitle = {Information Security Applications - 11th International Workshop, WISA 2010, Jeju Island, Korea, August 24-26, 2010, Revised Selected Papers}, editor = {Yongwha Chung and Moti Yung}, volume = {6513}, series = {Lecture Notes in Computer Science}, publisher = {Springer}, isbn = {978-3-642-17954-9}, }