RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Joseph Nguyen, David Turgis, David Bonciani, Brice Lhomme, Yann Carminati, Olivier Callen, Guillaume Guirleo, Lorenzo Ciampolini, Gérard Ghibaudo. RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs. In 25th IEEE North Atlantic Test Workshop, NATW 2016, Providence, RI, USA, May 9-11, 2016. pages 28-33, IEEE, 2016. [doi]

This author has not been identified. Look up 'Joseph Nguyen' in GoogleThis author has not been identified. Look up 'David Turgis' in GoogleThis author has not been identified. Look up 'David Bonciani' in GoogleThis author has not been identified. Look up 'Brice Lhomme' in GoogleThis author has not been identified. Look up 'Yann Carminati' in GoogleThis author has not been identified. Look up 'Olivier Callen' in GoogleThis author has not been identified. Look up 'Guillaume Guirleo' in GoogleThis author has not been identified. Look up 'Lorenzo Ciampolini' in GoogleThis author has not been identified. Look up 'Gérard Ghibaudo' in Google

runs on WebDSL