Joseph Nguyen, David Turgis, David Bonciani, Brice Lhomme, Yann Carminati, Olivier Callen, Guillaume Guirleo, Lorenzo Ciampolini, Gérard Ghibaudo. RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs. In 25th IEEE North Atlantic Test Workshop, NATW 2016, Providence, RI, USA, May 9-11, 2016. pages 28-33, IEEE, 2016. [doi]
@inproceedings{NguyenTBLCCGCG16,
title = {RAPIDO Testing and Modeling of Assisted Write and Read Operations for SRAMs},
author = {Joseph Nguyen and David Turgis and David Bonciani and Brice Lhomme and Yann Carminati and Olivier Callen and Guillaume Guirleo and Lorenzo Ciampolini and Gérard Ghibaudo},
year = {2016},
doi = {10.1109/NATW.2016.14},
url = {http://doi.ieeecomputersociety.org/10.1109/NATW.2016.14},
researchr = {https://researchr.org/publication/NguyenTBLCCGCG16},
cites = {0},
citedby = {0},
pages = {28-33},
booktitle = {25th IEEE North Atlantic Test Workshop, NATW 2016, Providence, RI, USA, May 9-11, 2016},
publisher = {IEEE},
isbn = {978-1-4673-8949-5},
}