Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors

Tien Duc Nguyen, Xuan Nam Tran, Tadashi Fujino. Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors. IEICE Transactions, 89-A(10):2535-2542, 2006. [doi]

Authors

Tien Duc Nguyen

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Xuan Nam Tran

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Tadashi Fujino

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