Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors

Tien Duc Nguyen, Xuan Nam Tran, Tadashi Fujino. Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors. IEICE Transactions, 89-A(10):2535-2542, 2006. [doi]

Abstract

Abstract is missing.