Tien Duc Nguyen, Xuan Nam Tran, Tadashi Fujino. Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors. IEICE Transactions, 89-A(10):2535-2542, 2006. [doi]
@article{NguyenTF06,
title = {Layer Error Characteristics of Lattice-Reduction Aided V-BLAST Detectors},
author = {Tien Duc Nguyen and Xuan Nam Tran and Tadashi Fujino},
year = {2006},
doi = {10.1093/ietfec/e89-a.10.2535},
url = {http://dx.doi.org/10.1093/ietfec/e89-a.10.2535},
researchr = {https://researchr.org/publication/NguyenTF06},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {89-A},
number = {10},
pages = {2535-2542},
}