Distributed Cycling in Charge Trap-Based 3D NAND Arrays: Model and Qualification Tests Implications - researchr publication

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Gianluca Nicosia, Niccolò Righetti, Yingda Dong. Distributed Cycling in Charge Trap-Based 3D NAND Arrays: Model and Qualification Tests Implications. In IEEE International Memory Workshop, IMW 2023, Monterey, CA, USA, May 21-24, 2023. pages 1-4, IEEE, 2023. [doi]

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