Ben Niewenhuis, R. D. Blanton, Mudit Bhargava, Ken Mai. SCAN-PUF: A low overhead Physically Unclonable Function from scan chain power-up states. In 2013 IEEE International Test Conference, ITC 2013, Anaheim, CA, USA, September 6-13, 2013. pages 1-8, IEEE Computer Society, 2013. [doi]
Abstract is missing.