Ben Niewenhuis, Balaji Ravikumar, Zeye Liu, R. D. Shawn Blanton. Path Delay Test of the Carnegie Mellon Logic Characterization Vehicle. In 37th IEEE VLSI Test Symposium, VTS 2019, Monterey, CA, USA, April 23-25, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.