Tanya Nigam, Andreas Kerber, T. Shen, R. Ranjan, L. Cao. Material and device innovation impact on reliability for scaled CMOS technologies. In 47th European Solid-State Device Research Conference, ESSDERC 2017, Leuven, Belgium, September 11-14, 2017. pages 134-139, IEEE, 2017. [doi]
Abstract is missing.