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Dirk Niggemeyer, Elizabeth M. Rudnick. Automatic Generation of Diagnostic March Tests. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 299-305, IEEE Computer Society, 2001. [doi]

This author has not been identified. Look up 'Dirk Niggemeyer' in GoogleThis author has not been identified. Look up 'Elizabeth M. Rudnick' in Google

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