Dirk Niggemeyer, Elizabeth M. Rudnick. Automatic Generation of Diagnostic March Tests. In 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA. pages 299-305, IEEE Computer Society, 2001. [doi]
@inproceedings{NiggemeyerR01,
title = {Automatic Generation of Diagnostic March Tests},
author = {Dirk Niggemeyer and Elizabeth M. Rudnick},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/vts/2001/1122/00/11220299abs.htm},
tags = {testing, diagnostics},
researchr = {https://researchr.org/publication/NiggemeyerR01},
cites = {0},
citedby = {0},
pages = {299-305},
booktitle = {19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April - 3 May 2001, Marina Del Rey, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-1122-8},
}