Phil Nigh. The Evolving Role of Test ... it is now a Value Add Operation. In Cristiana Bolchini, Yong-Bin Kim, Dimitris Gizopoulos, Mohammad Tehranipoor, editors, 23rd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2008), 1-3 October 2008, Boston, MA, USA. pages 3-3, IEEE Computer Society, 2008. [doi]
Abstract is missing.