Layout-driven test generation

Phil Nigh, Wojciech Maly. Layout-driven test generation. In 1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers. pages 154-157, IEEE, 1989. [doi]

Authors

Phil Nigh

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Wojciech Maly

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