Phil Nigh, Wojciech Maly. Layout-driven test generation. In 1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers. pages 154-157, IEEE, 1989. [doi]
@inproceedings{NighM89,
title = {Layout-driven test generation},
author = {Phil Nigh and Wojciech Maly},
year = {1989},
doi = {10.1109/ICCAD.1989.76925},
url = {http://dx.doi.org/10.1109/ICCAD.1989.76925},
researchr = {https://researchr.org/publication/NighM89},
cites = {0},
citedby = {0},
pages = {154-157},
booktitle = {1989 IEEE International Conference on Computer-Aided Design, ICCAD 1989, Santa Clara, CA, USA, November 5-9, 1989. Digest of Technical Papers},
publisher = {IEEE},
isbn = {0-8186-1986-4},
}