Dependable SRAM with enhanced read-/write-margins by fine-grained assist bias control for low-voltage operation

Koji Nii, Makoto Yabuuchi, Hidehiro Fujiwara, Hirofumi Nakano, Kazuya Ishihara, Hiroyuki Kawai, Kazutami Arimoto. Dependable SRAM with enhanced read-/write-margins by fine-grained assist bias control for low-voltage operation. In Thomas B├╝chner, Ramalingam Sridhar, Andrew Marshall, Norbert Schuhmann, editors, Annual IEEE International SoC Conference, SoCC 2010, September 27-29, 2010, Las Vegas, NV, USA, Proceedings. pages 519-524, IEEE, 2010. [doi]

Abstract

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