A 45-nm Bulk CMOS Embedded SRAM With Improved Immunity Against Process and Temperature Variations - researchr publication authors

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Koji Nii, Makoto Yabuuchi, Yasumasa Tsukamoto, Shigeki Ohbayashi, Susumu Imaoka, Hiroshi Makino, Yoshinobu Yamagami, Satoshi Ishikura, Toshio Terano, Toshiyuki Oashi, Keiji Hashimoto, Akio Sebe, Gen Okazaki, Katsuji Satomi, Hironori Akamatsu, Hirofumi Shinohara. A 45-nm Bulk CMOS Embedded SRAM With Improved Immunity Against Process and Temperature Variations. J. Solid-State Circuits, 43(1):180-191, 2008. [doi]

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