Post-Silicon Jitter Measurements

Kiichi Niitsu, Takahiro J. Yamaguchi, Masahiro Ishida, Haruo Kobayashi. Post-Silicon Jitter Measurements. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 258-263, IEEE Computer Society, 2012. [doi]

Abstract

Abstract is missing.