New Capabilities of OBIRCH Method for Fault Localization and Defect Detection

Kiyoshi Nikawa, Shoji Inoue. New Capabilities of OBIRCH Method for Fault Localization and Defect Detection. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 214, IEEE Computer Society, 1997. [doi]

Abstract

Abstract is missing.