Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone. Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method. In 8th Asian Test Symposium (ATS 99), 16-18 November 1999, Shanghai, China. pages 383-388, IEEE Computer Society, 1999. [doi]
Abstract is missing.