Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks - researchr publication authors

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Dimitris Nikolos, Haridimos T. Vergos, Th. Haniotakis, Y. Tsiatouhas. Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks. In 1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany. pages 112-116, IEEE Computer Society, 1999. [doi]

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