Dimitris Nikolos, Haridimos T. Vergos, Th. Haniotakis, Y. Tsiatouhas. Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks. In 1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany. pages 112-116, IEEE Computer Society, 1999. [doi]
@inproceedings{NikolosVHT99,
title = {Path Delay Fault Testing of ICs with Embedded Intellectual Property Blocks},
author = {Dimitris Nikolos and Haridimos T. Vergos and Th. Haniotakis and Y. Tsiatouhas},
year = {1999},
url = {http://csdl.computer.org/comp/proceedings/date/1999/0078/00/00780112abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/NikolosVHT99},
cites = {0},
citedby = {0},
pages = {112-116},
booktitle = {1999 Design, Automation and Test in Europe (DATE 99), 9-12 March 1999, Munich, Germany},
publisher = {IEEE Computer Society},
isbn = {0-7695-0078-1},
}