Nastaran Nikooienejad, Afshin Alipour, Mohammad Maroufi, S. O. Reza Moheimani. Sequential Cycloid Scanning for Time-resolved Atomic Force Microscopy. In 2018 IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM 2018, Auckland, New Zealand, July 9-12, 2018. pages 125-130, IEEE, 2018. [doi]
Abstract is missing.