Siddharth Nilakantan, Scott Lerner, Mark Hempstead, Baris Taskin. Can You Trust Your Memory Trace? A Comparison of Memory Traces from Binary Instrumentation and Simulation. In 28th International Conference on VLSI Design, VLSID 2015, Bangalore, India, January 3-7, 2015. pages 135-140, IEEE Computer Society, 2015. [doi]
@inproceedings{NilakantanLHT15,
title = {Can You Trust Your Memory Trace? A Comparison of Memory Traces from Binary Instrumentation and Simulation},
author = {Siddharth Nilakantan and Scott Lerner and Mark Hempstead and Baris Taskin},
year = {2015},
doi = {10.1109/VLSID.2015.28},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2015.28},
researchr = {https://researchr.org/publication/NilakantanLHT15},
cites = {0},
citedby = {0},
pages = {135-140},
booktitle = {28th International Conference on VLSI Design, VLSID 2015, Bangalore, India, January 3-7, 2015},
publisher = {IEEE Computer Society},
isbn = {978-1-4799-6658-5},
}