Siddharth Nilakantan, Scott Lerner, Mark Hempstead, Baris Taskin. Can You Trust Your Memory Trace? A Comparison of Memory Traces from Binary Instrumentation and Simulation. In 28th International Conference on VLSI Design, VLSID 2015, Bangalore, India, January 3-7, 2015. pages 135-140, IEEE Computer Society, 2015. [doi]
Abstract is missing.