Bingxu Ning, Dawei Bi, Huixiang Huang, Zhengxuan Zhang, Zhiyuan Hu, Ming Chen 0007, Shichang Zou. Bias dependence of TID radiation responses of 0.13 μm partially depleted SOI NMOSFETs. Microelectronics Reliability, 53(2):259-264, 2013. [doi]
Abstract is missing.