Speaker Siglet Detection for Business Microscope

Jun Nishimura, Nobuo Sato, Tadahiro Kuroda. Speaker Siglet Detection for Business Microscope. In M. Arif Wani, Xue-wen Chen, David Casasent, Lukasz A. Kurgan, Tony Hu, Khalid Hafeez, editors, Seventh International Conference on Machine Learning and Applications, ICMLA 2008, San Diego, California, USA, 11-13 December 2008. pages 376-381, IEEE Computer Society, 2008. [doi]

Authors

Jun Nishimura

This author has not been identified. Look up 'Jun Nishimura' in Google

Nobuo Sato

This author has not been identified. Look up 'Nobuo Sato' in Google

Tadahiro Kuroda

This author has not been identified. Look up 'Tadahiro Kuroda' in Google