Jun Nishimura, Nobuo Sato, Tadahiro Kuroda. Speaker Siglet Detection for Business Microscope. In M. Arif Wani, Xue-wen Chen, David Casasent, Lukasz A. Kurgan, Tony Hu, Khalid Hafeez, editors, Seventh International Conference on Machine Learning and Applications, ICMLA 2008, San Diego, California, USA, 11-13 December 2008. pages 376-381, IEEE Computer Society, 2008. [doi]
@inproceedings{NishimuraSK08-0,
title = {Speaker Siglet Detection for Business Microscope},
author = {Jun Nishimura and Nobuo Sato and Tadahiro Kuroda},
year = {2008},
doi = {10.1109/ICMLA.2008.132},
url = {http://dx.doi.org/10.1109/ICMLA.2008.132},
researchr = {https://researchr.org/publication/NishimuraSK08-0},
cites = {0},
citedby = {0},
pages = {376-381},
booktitle = {Seventh International Conference on Machine Learning and Applications, ICMLA 2008, San Diego, California, USA, 11-13 December 2008},
editor = {M. Arif Wani and Xue-wen Chen and David Casasent and Lukasz A. Kurgan and Tony Hu and Khalid Hafeez},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3495-4},
}