Kazumi Nishimura, Naoteru Shigekawa, Haruki Yokoyama, Masanobu Hiroki, Kohji Hohkawa. SAW characteristics of GaN layers with surfaces exposed by dry etching. IEICE Electronic Express, 2(19):501-505, 2005. [doi]
@article{NishimuraSYHH05, title = {SAW characteristics of GaN layers with surfaces exposed by dry etching}, author = {Kazumi Nishimura and Naoteru Shigekawa and Haruki Yokoyama and Masanobu Hiroki and Kohji Hohkawa}, year = {2005}, doi = {10.1587/elex.2.501}, url = {http://dx.doi.org/10.1587/elex.2.501}, researchr = {https://researchr.org/publication/NishimuraSYHH05}, cites = {0}, citedby = {0}, journal = {IEICE Electronic Express}, volume = {2}, number = {19}, pages = {501-505}, }