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Detecting Data Drift with KS Test Using Attention Map

Tsunemi Nitta, Yuzhi Shi, Tsubasa Hirakawa, Takayoshi Yamashita, Hironobu Fujiyoshi. Detecting Data Drift with KS Test Using Attention Map. In Huimin Lu 0001, Michael Blumenstein, Sung-Bae Cho, Cheng-Lin Liu, Yasushi Yagi, Tohru Kamiya, editors, Pattern Recognition - 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part I. Volume 14406 of Lecture Notes in Computer Science, pages 68-80, Springer, 2023. [doi]

Authors

Tsunemi Nitta

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Yuzhi Shi

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Tsubasa Hirakawa

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Takayoshi Yamashita

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Hironobu Fujiyoshi

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