Tsunemi Nitta, Yuzhi Shi, Tsubasa Hirakawa, Takayoshi Yamashita, Hironobu Fujiyoshi. Detecting Data Drift with KS Test Using Attention Map. In Huimin Lu 0001, Michael Blumenstein, Sung-Bae Cho, Cheng-Lin Liu, Yasushi Yagi, Tohru Kamiya, editors, Pattern Recognition - 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part I. Volume 14406 of Lecture Notes in Computer Science, pages 68-80, Springer, 2023. [doi]
Abstract is missing.