Tsunemi Nitta, Yuzhi Shi, Tsubasa Hirakawa, Takayoshi Yamashita, Hironobu Fujiyoshi. Detecting Data Drift with KS Test Using Attention Map. In Huimin Lu 0001, Michael Blumenstein, Sung-Bae Cho, Cheng-Lin Liu, Yasushi Yagi, Tohru Kamiya, editors, Pattern Recognition - 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part I. Volume 14406 of Lecture Notes in Computer Science, pages 68-80, Springer, 2023. [doi]
@inproceedings{NittaSHYF23,
title = {Detecting Data Drift with KS Test Using Attention Map},
author = {Tsunemi Nitta and Yuzhi Shi and Tsubasa Hirakawa and Takayoshi Yamashita and Hironobu Fujiyoshi},
year = {2023},
doi = {10.1007/978-3-031-47634-1_6},
url = {https://doi.org/10.1007/978-3-031-47634-1_6},
researchr = {https://researchr.org/publication/NittaSHYF23},
cites = {0},
citedby = {0},
pages = {68-80},
booktitle = {Pattern Recognition - 7th Asian Conference, ACPR 2023, Kitakyushu, Japan, November 5-8, 2023, Proceedings, Part I},
editor = {Huimin Lu 0001 and Michael Blumenstein and Sung-Bae Cho and Cheng-Lin Liu and Yasushi Yagi and Tohru Kamiya},
volume = {14406},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-031-47634-1},
}