I. Nofal, Adrian Evans, A.-L. He, Gang Guo, Yuanqing Li, Li Chen, Rui Liu, H. B. Wang, Mo Chen, S. H. Baeg, Shi-Jie Wen, Richard Wong. BPPT - Bulk potential protection technique for hardened sequentials. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 28-32, IEEE, 2017. [doi]
@inproceedings{NofalEHGLCLWCBW17,
title = {BPPT - Bulk potential protection technique for hardened sequentials},
author = {I. Nofal and Adrian Evans and A.-L. He and Gang Guo and Yuanqing Li and Li Chen and Rui Liu and H. B. Wang and Mo Chen and S. H. Baeg and Shi-Jie Wen and Richard Wong},
year = {2017},
doi = {10.1109/IOLTS.2017.8046194},
url = {https://doi.org/10.1109/IOLTS.2017.8046194},
researchr = {https://researchr.org/publication/NofalEHGLCLWCBW17},
cites = {0},
citedby = {0},
pages = {28-32},
booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017},
publisher = {IEEE},
isbn = {978-1-5386-0352-9},
}