Optimization Methods for Post-Bond Testing of 3D Stacked ICs

Brandon Noia, Krishnendu Chakrabarty, Erik Jan Marinissen. Optimization Methods for Post-Bond Testing of 3D Stacked ICs. J. Electronic Testing, 28(1):103-120, 2012. [doi]

Authors

Brandon Noia

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Krishnendu Chakrabarty

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Erik Jan Marinissen

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