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Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point

Michail Noltsis, Eleni Maragkoudaki, Dimitrios Rodopoulos, Francky Catthoor, Dimitrios Soudris. Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point. Integration, 69:111-119, 2019. [doi]

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Michail Noltsis

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Eleni Maragkoudaki

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Dimitrios Rodopoulos

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Francky Catthoor

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Dimitrios Soudris

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