Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point

Michail Noltsis, Eleni Maragkoudaki, Dimitrios Rodopoulos, Francky Catthoor, Dimitrios Soudris. Failure probability of a FinFET-based SRAM cell utilizing the most probable failure point. Integration, 69:111-119, 2019. [doi]

Abstract

Abstract is missing.