Shuou Nomura, Matthew D. Sinclair, Chen-Han Ho, Venkatraman Govindaraju, Marc de Kruijf, Karthikeyan Sankaralingam. Sampling + DMR: practical and low-overhead permanent fault detection. In Ravi Iyer, Qing Yang, Antonio González, editors, 38th International Symposium on Computer Architecture (ISCA 2011), June 4-8, 2011, San Jose, CA, USA. pages 201-212, ACM, 2011. [doi]
Abstract is missing.