Gethin J. Norman, David Parker, Marta Z. Kwiatkowska, Sandeep K. Shukla. Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking. In 17th International Conference on VLSI Design (VLSI Design 2004), with the 3rd International Conference on Embedded Systems Design, 5-9 January 2004, Mumbai, India. pages 907, IEEE Computer Society, 2004. [doi]
Abstract is missing.