An ESL Environment for Modeling Electrical Interconnect Faults

Nooshin Nosrati, Katayoon Basharkhah, Rezgar Sadeghi, Zainalabedin Navabi. An ESL Environment for Modeling Electrical Interconnect Faults. In 2019 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2019, Miami, FL, USA, July 15-17, 2019. pages 88-93, IEEE, 2019. [doi]

Abstract

Abstract is missing.