ESD protection for thin gate oxides in 65 nm

Guido Notermans, Theo Smedes, Zeljko Mrcarica, Peter C. de Jong, Ralph Stephan, Hans van Zwol, Dejan M. Maksimovic. ESD protection for thin gate oxides in 65 nm. Microelectronics Reliability, 50(1):26-31, 2010. [doi]

Abstract

Abstract is missing.