Theo Smedes - researchr alias

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Viewing Publication 1 - 11 from 11

2018

An integral injector-victim current transfer model for latchup design rule optimizationGuido Quax, Theo Smedes. irps 2018: 2 [doi]

2011

On-chip system level protection of FM antenna pin with improved linearityGuido Notermans, Dejan M. Maksimovic, Gerd Vermont, Michiel van Maasakkers, Fredrik Pusa, Theo Smedes. mr, 51(12):2129-2136, 2011. [doi]

2010

ESD protection for thin gate oxides in 65 nmGuido Notermans, Theo Smedes, Zeljko Mrcarica, Peter C. de Jong, Ralph Stephan, Hans van Zwol, Dejan M. Maksimovic. mr, 50(1):26-31, 2010. [doi]

2009

An ESD test reduction method for complex devicesDejan M. Maksimovic, Fabrice Blanc, Guido Notermans, Theo Smedes, Thomas Keller. mr, 49(12):1465-1469, 2009. [doi]

ESD robust high-voltage active clampsGuido Notermans, Olivier Quittard, Anco Heringa, Zeljko Mrcarica, Fabrice Blanc, Hans van Zwol, Theo Smedes, Thomas Keller, Peter C. de Jong. mr, 49(12):1433-1439, 2009. [doi]

2005

A 3-D Circuit Model to evaluate CDM performance of ICsM. S. B. Sowariraj, Theo Smedes, Peter C. de Jong, Cora Salm, Ton J. Mouthaan, Fred G. Kuper. mr, 45(9-11):1425-1429, 2005. [doi]

2004

Study and validation of a power-rail ESD clamp in BiCMOS process with a reduced temperature dependency of its leakage currentF. Barbier, Fabrice Blanc, A. Le Grontec, R. Colclaser, Theo Smedes, M. Johnson, Serge Bardy, Philippe Descamps. mr, 44(9-11):1799-1804, 2004. [doi]

A case study of ESD failures at random levels: analysis, explanation and solutionT. Wu, Theo Smedes, J. P. Lokker, S.-N. Mei, J. W. Slotboom. mr, 44(9-11):1823-1827, 2004. [doi]

2003

A simple design methodology for increased ESD robustness of CMOS core cellsAlbert Jan Huitsing, Theo Smedes, H.-U. Schroder. esscirc 2003: 481-484 [doi]

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels -An explanation and die protection strategyM. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper. mr, 43(9-11):1569-1575, 2003. [doi]

2002

The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stressM. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper. mr, 42(9-11):1287-1292, 2002. [doi]

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