The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress

M. S. B. Sowariraj, Theo Smedes, Cora Salm, Ton J. Mouthaan, Fred G. Kuper. The influence of technology variation on ggNMOSTs and SCRs against CDM BSD stress. Microelectronics Reliability, 42(9-11):1287-1292, 2002. [doi]

Abstract

Abstract is missing.