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Normalized differential conductance to study current conduction mechanisms in MOS structures

T. H. Nouibat, Z. Messai, D. Chikouch, Z. Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey. Normalized differential conductance to study current conduction mechanisms in MOS structures. Microelectronics Reliability, 91:183-187, 2018. [doi]

Authors

T. H. Nouibat

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Z. Messai

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D. Chikouch

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Z. Ouennoughi

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N. Rouag

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Mathias Rommel

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Lothar Frey

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