Lothar Frey - researchr alias

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Viewing Publication 1 - 11 from 11

2018

Normalized differential conductance to study current conduction mechanisms in MOS structuresT. H. Nouibat, Z. Messai, D. Chikouch, Z. Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey. mr, 91:183-187, 2018. [doi]

2017

®s for Temperature SensingMaiko Girschikofsky, Manuel Rosenberger, Michael Förthner, Mathias Rommel, Lothar Frey, Ralf Hellmann. sensors, 17(11):2459, 2017. [doi]

Determination of the Selectivity of Printed Wearable Sweat SensorsAlicia Zörner, Susanne Oertel, Björn Schmitz, Nadine Lang, Michael P. M. Jank, Lothar Frey. biostec 2017: 81-87 [doi]

2016

Screen-printed Biochemical Sensors for Detection of Ammonia Levels in Sweat - Towards Integration with Vital Parameter Monitoring Sports GearSusanne Oertel, Michael P. M. Jank, Lothar Frey, Christian Hofmann, Nadine Lang, Matthias Struck. biostec 2016: 160-165 [doi]

2015

Current conduction mechanism of MIS devices using multidimensional minimization system programN. Rouag, Z. Ouennoughi, M. Rommel, K. Murakami, Lothar Frey. mr, 55(7):1028-1034, 2015. [doi]

2013

Conduction mechanisms in thermal nitride and dry gate oxides grown on 4H-SiCZ. Ouennoughi, C. Strenger, F. Bourouba, V. Haeublein, Heiner Ryssel, Lothar Frey. mr, 53(12):1841-1847, 2013. [doi]

2011

Investigation of the reliability of 4H-SiC MOS devices for high temperature applicationsMartin Le-Huu, Holger Schmitt, Stefan Noll, Michael Grieb, Frederik F. Schrey, Anton J. Bauer, Lothar Frey, Heiner Ryssel. mr, 51(8):1346-1350, 2011. [doi]

+n-source/drain diodesGuntrade Roll, Matthias Goldbach, Lothar Frey. mr, 51(12):2081-2085, 2011. [doi]

2005

Electrical properties of hafnium silicate films obtained from a single-source MOCVD precursorMartin Lemberger, Albena Paskaleva, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel. mr, 45(5-6):819-822, 2005. [doi]

2003

Electrical characterization of zirconium silicate films obtained from novel MOCVD precursorsAlbena Paskaleva, Martin Lemberger, Stefan Zürcher, Anton J. Bauer, Lothar Frey, Heiner Ryssel. mr, 43(8):1253-1257, 2003. [doi]

2001

Electrical reliability aspects of through the gate implanted MOS structures with thin oxidesM. P. M. Jank, Martin Lemberger, Anton J. Bauer, Lothar Frey, Heiner Ryssel. mr, 41(7):987-990, 2001. [doi]

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