Current conduction mechanism of MIS devices using multidimensional minimization system program

N. Rouag, Z. Ouennoughi, M. Rommel, K. Murakami, Lothar Frey. Current conduction mechanism of MIS devices using multidimensional minimization system program. Microelectronics Reliability, 55(7):1028-1034, 2015. [doi]

Abstract

Abstract is missing.