T. H. Nouibat, Z. Messai, D. Chikouch, Z. Ouennoughi, N. Rouag, Mathias Rommel, Lothar Frey. Normalized differential conductance to study current conduction mechanisms in MOS structures. Microelectronics Reliability, 91:183-187, 2018. [doi]
@article{NouibatMCORRF18,
title = {Normalized differential conductance to study current conduction mechanisms in MOS structures},
author = {T. H. Nouibat and Z. Messai and D. Chikouch and Z. Ouennoughi and N. Rouag and Mathias Rommel and Lothar Frey},
year = {2018},
doi = {10.1016/j.microrel.2018.10.001},
url = {https://doi.org/10.1016/j.microrel.2018.10.001},
researchr = {https://researchr.org/publication/NouibatMCORRF18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {91},
pages = {183-187},
}