Statistical fault analysis for a lightweight block cipher TWINE

Yusuke Nozaki, Kensaku Asahi, Masaya Yoshikawa. Statistical fault analysis for a lightweight block cipher TWINE. In IEEE 4th Global Conference on Consumer Electronics, GCCE 2015, Osaka, Japan, 27-30 October 2015. pages 477-478, IEEE, 2015. [doi]

Authors

Yusuke Nozaki

This author has not been identified. Look up 'Yusuke Nozaki' in Google

Kensaku Asahi

This author has not been identified. Look up 'Kensaku Asahi' in Google

Masaya Yoshikawa

This author has not been identified. Look up 'Masaya Yoshikawa' in Google