Yusuke Nozaki, Kensaku Asahi, Masaya Yoshikawa. Statistical fault analysis for a lightweight block cipher TWINE. In IEEE 4th Global Conference on Consumer Electronics, GCCE 2015, Osaka, Japan, 27-30 October 2015. pages 477-478, IEEE, 2015. [doi]
@inproceedings{NozakiAY15,
title = {Statistical fault analysis for a lightweight block cipher TWINE},
author = {Yusuke Nozaki and Kensaku Asahi and Masaya Yoshikawa},
year = {2015},
doi = {10.1109/GCCE.2015.7398568},
url = {https://doi.org/10.1109/GCCE.2015.7398568},
researchr = {https://researchr.org/publication/NozakiAY15},
cites = {0},
citedby = {0},
pages = {477-478},
booktitle = {IEEE 4th Global Conference on Consumer Electronics, GCCE 2015, Osaka, Japan, 27-30 October 2015},
publisher = {IEEE},
}