Statistical fault analysis for a lightweight block cipher TWINE

Yusuke Nozaki, Kensaku Asahi, Masaya Yoshikawa. Statistical fault analysis for a lightweight block cipher TWINE. In IEEE 4th Global Conference on Consumer Electronics, GCCE 2015, Osaka, Japan, 27-30 October 2015. pages 477-478, IEEE, 2015. [doi]

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