Srinivasa Shashank Nuthakki, Santanu Chattopadhyay, Mrityunjoy Chakraborty. Test set customization for improved fault diagnosis without sacrificing coverage. In 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015, Lisbon, Portugal, May 24-27, 2015. pages 1574-1577, IEEE, 2015. [doi]
Abstract is missing.